4 results
Pivot Point: The Key to TEM Automation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2920-2921
- Print publication:
- August 2022
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Doing More with Less: Artificial Intelligence Guided Analytics for Electron Microscopy Applications
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2988-2989
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- August 2022
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Quantifying Defect Pathways for Disorder in La1-xSrxFeO3 / SrTiO3 Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2108-2109
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- August 2022
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An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 10 June 2022, pp. 1611-1621
- Print publication:
- October 2022
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